Ultraviolet–visible wavelength Detector (UV/VIS)
This UV/VIS Detector SpectraFlow 2020 provides continuously variable wavelength with a range of 190 – 600 nm (STD) or alternatively 190 – 800 nm (EXT).
The noise level of both detectors is ±3 x 10-6 AU.
The unit may be used for analytical applications as well as for preparative/flash chromatography, according to the selected cell. It is easy to operate; light intensities for reference and sample channels are available for detector diagnostics as well as information on lamp operating hours. The detector performs an automatic wavelength calibration after the lamp has been switched on. A high standard deuterium lamp in a special socket enables easy exchange.
The output signal is available in both digital and analog form. The detector can be programmed, controlled and used together with the software Clarity® or ChromStar® via RS232 or Ethernet interface. The detector comes with an analytical flow cell (with 5 or 10 mm light path) as an included component. The cell can be easily removed from the front of the unit.
TECHNICHAL SPECIFICATIONS
| Analytical specifications | |
|---|---|
| Wavelength range | 190 – 600 nm (STD) 190 – 800 nm (EXT) |
| Spectral half-width | 6 nm |
| Accuracy of adjustment | ± 1 nm |
| Reproducibility | ± 0.5 nm |
| Light source | Deuterium discharge lamp, halogen lamp |
| Noise (Test cell, 254 nm, TC 1s, 10 Hz) | ± 3 x 10-6 AU |
| Drift (Test cell, 254 nm) | 1 x 10-4 AU p.hr. |
| Time constant | 20 – 10 000 ms |
| Sampling speed | up to 100 Hz |
| Digital output | 1 V/AU |
| Analog output | 1; configurable; (0,2 – 10 V = 1 AU) |
| Wetted materials | dependent on a cell – fused silica, PTFE, stainless steel, Vespel, PEEK |
| General | |
|---|---|
| Communication | RS232, Ethernet (LAN) |
| Display | VFD; 140 x 32 pixels |
| Keypad | 10 Pushbuttons |
| Power supply | 100 – 240V ±10 %; 50 – 60 Hz; 110 VA |
| Dimensions (w x h x d) | 280 x 135 x 498 mm |
| Weight | 9 kg |
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